Cookies on this website
We use cookies to ensure that we give you the best experience on our website. If you click 'Continue' we'll assume that you are happy to receive all cookies and you won't see this message again. Click 'Find out more' for information on how to change your cookie settings.

Here we present, for the first time, an extension of spatially offset Raman spectroscopy to thin (tens of micrometers thick), highly turbid stratified media such as those encountered in paintings. The method permits the non-destructive interrogation of painted layers in situations where conventional Raman microscopy is not applicable due to high turbidity of the top layer(s). The concept is demonstrated by recovering the pure Raman spectra of paint sub-layers that are completely obscured by paint over-layers. Potential application areas include the analysis of paintings in art preservation and restoration avoiding the cross-sectional analysis used currently with this type of samples. The technique also holds promise for the development as a non-destructive subsurface tool for in situ analysis using portable instruments.

Original publication

DOI

10.1366/13-07376

Type

Journal

Applied spectroscopy

Publication Date

01/2014

Volume

68

Pages

686 - 691

Addresses

Consiglio Nazionale delle Ricerche, Istituto per la Conservazione e la Valorizzazione dei Beni Culturali (ICVBC), Via Cozzi 53, 20125, Milan, Italy.

Keywords

Epoxy Resins, Spectrum Analysis, Raman, Paint, Paintings